Measurement Of The Elastic Constants Of Nanometer-thick Films (2002)
Journal Article
Beghi, M., Bottani, C., Bassi, A., Ossi, P., Tanner, B., Ferrari, A., & Robertson, J. (2002). Measurement Of The Elastic Constants Of Nanometer-thick Films. Materials Science and Engineering: C, 19, 201-204

Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors (2002)
Journal Article
Wilkins, S., Spencer, P., Hatton, P., Tanner, B., Lafford, T., Spence, J., & Loxley, N. (2002). Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors. Review of Scientific Instruments, 73(7), 2666-2671. https://doi.org/10.1063/1.1484240

Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions (2002)
Journal Article
Buchanan, J., Hase, T., Tanner, B., Hughes, N., & Hicken, R. (2002). Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions. Applied Physics Letters, 81(4), 751-753. https://doi.org/10.1063/1.1496131

The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge... Read More about Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions.

Measurement Of The Elastic Constants Of Nanometric Films (2001)
Journal Article
Beghi, M., Bottani, C., Bassi, A., Tanner, B., Ferrari, A., Teo, K., & Robertson, J. (2001). Measurement Of The Elastic Constants Of Nanometric Films. Proceedings of SPIE, 4449, 119-130

High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers (2001)
Journal Article
Fulthorpe, B., Ryan, P., Hase, T., Tanner, B., & Hickey, B. (2001). High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers. Journal of Physics D: Applied Physics, 34, A203-A207

Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers (2001)
Journal Article
Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1717-1719

Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina (2001)
Journal Article
Tanner, B., Hase, T., & Wu, H. (2001). Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina. Philosophical Magazine Letters, 81, 351-355

Brillouin Scattering Investigation Of Melting In Sn Nanoparticles (2001)
Journal Article
Bottani, C., Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2001). Brillouin Scattering Investigation Of Melting In Sn Nanoparticles. Materials Science and Engineering: C, 15, 41-43

X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers (2001)
Journal Article
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1728-1729

Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films (2001)
Journal Article
Vaz, C., Lauhoff, G., Bland, J., Fulthorpe, B., Hase, T., Tanner, B., …Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials, 226, 1618-1620

In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs (2001)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D: Applied Physics, 34, A109-A113

Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers (2001)
Journal Article
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B, 64, 245404-

Kinetics Of Native Oxide Film Growth On Epiready Gaas (2001)
Journal Article
Tanner, B., Allwood, D., & Mason, N. (2001). Kinetics Of Native Oxide Film Growth On Epiready Gaas. Materials Science and Engineering: B, 80, 99-103

Structural and magnetic changes on annealing permalloy/copper multilayers (2001)
Journal Article
Fulthorpe, B., Hase, T., Tanner, B., Marrows, C., & Hickey, B. (2001). Structural and magnetic changes on annealing permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1733-1734

Weak magnetic moment on IrMn exchange bias pinning layers (2001)
Journal Article
Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Weak magnetic moment on IrMn exchange bias pinning layers. Applied Physics Letters, 79(7), 985-987. https://doi.org/10.1063/1.1392304

We present evidence from soft x-ray resonant magnetic scattering measurements at the Mn L3 edge for the existence of a small magnetic moment on the antiferromagnetic IrMn pinning layer in a NiFe/Cu/Co/IrMn spin valve structure. The variation of the s... Read More about Weak magnetic moment on IrMn exchange bias pinning layers.

Experimental evidence for electron channeling in Fe /Au (100) superlattices (2001)
Journal Article
Dekadjevi, D., Ryan, P., Fulthorpe, B., Hickey, B., & Tanner, B. (2001). Experimental evidence for electron channeling in Fe /Au (100) superlattices. Physical Review Letters, 86(25), 5787-5790. https://doi.org/10.1103/physrevlett.86.5787

We present transport and structural data from epitaxial (100) and (111) Au/Fe superlattices grown by molecular beam epitaxy. From their analysis, we conclude that an electron channeling mechanism, due to strong specular reflection of the minority spi... Read More about Experimental evidence for electron channeling in Fe /Au (100) superlattices.

Characterization Of Oxide Layers On Gaas Substrates (2000)
Journal Article
Allwood, D., Carline, R., Mason, N., Pickering, C., Tanner, B., & Walker, P. (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films, 364, 33-39

X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates (2000)
Journal Article
Su, Y., Du, C., Tanner, B., Hatton, P., Collins, S., Brown, S., …Cheong, S. (2000). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates

Dependence of the critical thickness on Si doping of InGaAs on GaAs (2000)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158

The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles (2000)
Journal Article
Li Bassi, A., Bottani, C., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. The European Physical Journal C, 18, 31-38