G.M. Luo
Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers
Luo, G.M.; Mai, Z.H.; Hase, T.P.A.; Fulthorpe, B.D.; Tanner, B.K.; Marrows, C.H.; Hickey, B.J.
Authors
Z.H. Mai
T.P.A. Hase
B.D. Fulthorpe
Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
C.H. Marrows
B.J. Hickey
Citation
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B, 64, 245404-
| Journal Article Type | Article |
|---|---|
| Publication Date | 2001 |
| Journal | Physical Review B |
| Print ISSN | 2469-9950 |
| Publisher | American Physical Society |
| Volume | 64 |
| Pages | 245404- |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2001PhRvB..64x5404L&db_key=PHY |
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