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Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films

Vaz, C.A.F.; Lauhoff, G.; Bland, J.A.C.; Fulthorpe, B.D.; Hase, T.P.A.; Tanner, B.K.; Langridge, S.; Penfold, J.

Authors

C.A.F. Vaz

G. Lauhoff

J.A.C. Bland

B.D. Fulthorpe

T.P.A. Hase

S. Langridge

J. Penfold



Citation

Vaz, C., Lauhoff, G., Bland, J., Fulthorpe, B., Hase, T., Tanner, B., …Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials, 226, 1618-1620

Journal Article Type Article
Publication Date 2001
Journal Journal of Magnetism and Magnetic Materials
Print ISSN 0304-8853
Publisher Elsevier
Volume 226
Pages 1618-1620
Public URL https://durham-repository.worktribe.com/output/1587864
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2001JMMM..226.1618V&db_key=PHY



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