Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
P.J. Parbrook
C.R. Whitehouse
A.M. Keir
A.D. Johnson
J. Jones
D. Wallis
L.M. Smith
B. Lunn
J.H.C. Hogg
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D: Applied Physics, 34, A109-A113
Journal Article Type | Article |
---|---|
Publication Date | 2001 |
Journal | Journal of Physics D Applied Physics |
Print ISSN | 0022-3727 |
Publisher | IOP Publishing |
Volume | 34 |
Pages | A109-A113 |
Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2001JPhD...34A.109T&db_key=PHY |
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