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X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers

Luo, G.M.; Mai, Z.H.; Hase, T.P.A.; Fulthorpe, B.D.; Tanner, B.K.; Marrows, C.H.; Hickey, B.J.

Authors

G.M. Luo

Z.H. Mai

T.P.A. Hase

B.D. Fulthorpe

C.H. Marrows

B.J. Hickey



Citation

Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1728-1729

Journal Article Type Article
Publication Date 2001
Journal Journal of Magnetism and Magnetic Materials
Print ISSN 0304-8853
Electronic ISSN 1873-4766
Publisher Elsevier
Volume 226
Pages 1728-1729
Public URL https://durham-repository.worktribe.com/output/1587847
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2001JMMM..226.1728L&db_key=PHY