Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
P.J. Parbrook
C.R. Whitehouse
A.M. Keir
A.D. Johnson
J. Jones
D. Wallis
L.M. Smith
B. Lunn
J.H.C. Hogg
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158
Journal Article Type | Article |
---|---|
Publication Date | 2000 |
Journal | Applied Physics Letters |
Print ISSN | 0003-6951 |
Publisher | American Institute of Physics |
Volume | 77 |
Pages | 2156-2158 |
Public URL | https://durham-repository.worktribe.com/output/1618797 |
Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2000ApPhL..77.2156T&db_key=PHY |
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