All Outputs (14)

Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers (1996)
Conference Proceeding
Cockerton, S., Cooke, M., Bowen, D., & Tanner, B. (1996). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers. In S. Pang, O. Glembocki, F. Pollak, F. Celii, & C. SotomayorTorres (Eds.),

The Effect Of Carbon Content On The Magnetisation Of Steel (1996)
Book Chapter
Makar, J., & Tanner, B. (1996). The Effect Of Carbon Content On The Magnetisation Of Steel. In A. Moses, & A. Basak (Eds.), Nonlinear Electromagnetic Systems (472-475). I O S PRESS

Contrast Of Defects In X-ray Diffraction Topographs (1996)
Book Chapter
Tanner, B. (1996). Contrast Of Defects In X-ray Diffraction Topographs. In A. Authier, S. Lagomarsino, & B. K. Tanner (Eds.), X-Ray and Neutron Dynamical Diffraction, Theory and Applications (147-166). PLENUM PRESS DIV PLENUM PUBLISHING CORP

Effect of annealing on the roughness and GMR of Fe/Cr multilayers (1996)
Journal Article
Hickey, B., Laidler, H., Hase, T., Tanner, B., Schad, R., & Bruynseraede, Y. (1996). Effect of annealing on the roughness and GMR of Fe/Cr multilayers. Journal of Magnetism and Magnetic Materials, 156, 332-334

Simulation Of Decorated Dislocation Images In X-ray Section Topographs (1996)
Journal Article
Holland, A., & Tanner, B. (1996). Simulation Of Decorated Dislocation Images In X-ray Section Topographs. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 73, 1451-1474

X-ray Scattering For Semiconductor Characterisation (1996)
Journal Article
Tanner, B. (1996). X-ray Scattering For Semiconductor Characterisation

Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction (1996)
Journal Article
Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., …Hogg, J. (1996). Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1051-1055

Evidence For Grading At Polished Surfaces From Grazing-incidence X-ray Scattering (1996)
Journal Article
Wormington, M., Pape, I., Hase, T., Tanner, B., & Bowen, D. (1996). Evidence For Grading At Polished Surfaces From Grazing-incidence X-ray Scattering. Philosophical Magazine Letters, 74, 211-216

ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction (1996)
Journal Article
Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., …Hogg, J. (1996). ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1363-

Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers (1996)
Journal Article
Tanner, B., Pape, I., Hase, T., Laidler, H., Emmerson, C., Hickey, B., & Shen, T. (1996). Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers. Journal of Magnetism and Magnetic Materials, 156, 373-374

X-ray and magnetoresistance measurements of annealed Co/Cu multilayers (1996)
Journal Article
Hickey, B., Laidler, H., Pape, I., Gregory, C., & Tanner, B. (1996). X-ray and magnetoresistance measurements of annealed Co/Cu multilayers. Journal of Magnetism and Magnetic Materials, 154, 165-174

Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K (1996)
Journal Article
Banister, A., Bricklebank, N., Lavender, I., Rawson, J., Gregory, C., Tanner, B., …Palacio, F. (1996). Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K. Angewandte Chemie International Edition, 35, 2533-2535

Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies (1996)
Journal Article
Bryce, M., Moore, A., Tanner, B., Whitehead, R., Clegg, W., Gerson, F., …Pfenninger, S. (1996). Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies. Chemistry of Materials, 8, 1182-1188

Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials (1996)
Journal Article
Loxley, N., Gray, T., Tanner, B., & Bowen, D. (1996). Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials. AIP Conference Proceedings, 672-677