S Cockerton
Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers
Cockerton, S; Cooke, ML; Bowen, DK; Tanner, BK
Authors
Contributors
S.W. Pang
Editor
O.J. Glembocki
Editor
F.H. Pollak
Editor
F.G. Celii
Editor
C.M. SotomayorTorres
Editor
Citation
Cockerton, S., Cooke, M., Bowen, D., & Tanner, B. (1996, December). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing II, Boston
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | Symposium on Diagnostic Techniques for Semiconductor Materials Processing II |
| Publication Date | 1996 |
| Volume | 406 |
| Pages | 555-560 |
| Series ISSN | 0272-9172 |
| Public URL | https://durham-repository.worktribe.com/output/1695267 |
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