All Outputs (77)

Nanofabrication of 30 nm Devices Incorporating Low Resistance Magnetic Tunnel Junctions (2010)
Journal Article
Macedo, R., Borme, J., Ferreira, R., Cardoso, S., Freitas, P., Mendis, B., & MacKenzie, M. (2010). Nanofabrication of 30 nm Devices Incorporating Low Resistance Magnetic Tunnel Junctions. Journal of Nanoscience and Nanotechnology, 10(9), 5951-5957. https://doi.org/10.1166/jnn.2010.2600

Analysis of computational EELS modelling results for MgO-based systems (2010)
Journal Article
Seabourne, C., Scott, A., Vaughan, G., Brydson, R., Wang, S., Ward, R., …Petford-Long, A. (2010). Analysis of computational EELS modelling results for MgO-based systems. Ultramicroscopy, 110(8), 1059-1069. https://doi.org/10.1016/j.ultramic.2009.11.021

Preparation, Characterization, and Structural Phase Transitions in a New Family of Semiconducting Transition Metal Oxychalcogenides beta-La(2)O(2)MSe(2) (M = Mn, Fe) (2010)
Journal Article
McCabe, E., Free, D., Mendis, B., Higgins, J., & Evans, J. (2010). Preparation, Characterization, and Structural Phase Transitions in a New Family of Semiconducting Transition Metal Oxychalcogenides beta-La(2)O(2)MSe(2) (M = Mn, Fe). Chemistry of Materials, 22(22), 6171-6182. https://doi.org/10.1021/cm1023103

Electron beam-specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal (2010)
Journal Article
Mendis, B. (2010). Electron beam-specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal. Acta crystallographica. Section A, Foundations of crystallography, 66, 407-420. https://doi.org/10.1107/s0108767310004770

A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy (2010)
Journal Article
Mendis, B., MacKenzie, M., & Craven, A. (2010). A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), 105-117. https://doi.org/10.1016/j.ultramic.2009.09.013

A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics (2010)
Journal Article
Mendis, B., Bowen, L., & Jiang, Q. (2010). A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics. Applied Physics Letters, 97(9), Article 092112. https://doi.org/10.1063/1.3486482

A cathodoluminescence-based, contactless method for extracting the bulk minority carrier diffusion length and reduced recombination velocity of an individual grain boundary is applied to vapor grown CdTe epitaxial films. The measured diffusion length... Read More about A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics.

Effects of thickness on the cation segregation in epitaxial (001) and (110) La2/3Ca1/3MnO3 thin films (2009)
Journal Article
Estrade, S., Rebled, J., Arbiol, J., Peiro, F., Infante, I., Herranz, G., …Bleloch, A. (2009). Effects of thickness on the cation segregation in epitaxial (001) and (110) La2/3Ca1/3MnO3 thin films. Applied Physics Letters, 95(7), Article 072507. https://doi.org/10.1063/1.3211130

Characterizing the microstructure and mechanical behavior of a two-phase NiCoCrAlY bond coat for thermal barrier systems (2008)
Journal Article
Hemker, K., Mendis, B., & Eberl, C. (2008). Characterizing the microstructure and mechanical behavior of a two-phase NiCoCrAlY bond coat for thermal barrier systems. Materials Science and Engineering: A, 483, 727-730

Elastic scattering of high-energy electrons by dopant atoms within a crystal in transmission electron microscopy (2008)
Journal Article
Mendis, B. (2008). Elastic scattering of high-energy electrons by dopant atoms within a crystal in transmission electron microscopy. Acta crystallographica. Section A, Foundations of crystallography, 64, 613-624. https://doi.org/10.1107/s0108767308024574

Thermal stability of microstructural phases in commercial NiCoCrAlY bond coats (2008)
Journal Article
Mendis, B., & Hemker, K. (2008). Thermal stability of microstructural phases in commercial NiCoCrAlY bond coats. Scripta Materialia, 58(4), 255-258

Bloch wave analysis of the Eshelby twist contrast around end-on screw dislocations in bcc Mo (2008)
Journal Article
Mendis, B., & Hemkerc, K. (2008). Bloch wave analysis of the Eshelby twist contrast around end-on screw dislocations in bcc Mo. Ultramicroscopy, 108(9), 855-864

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films (2008)
Journal Article
Gianola, D., Mendis, B., Cheng, X., & Hemker, K. (2008). Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films. Materials Science and Engineering: A, 483, 637-640

Evolution of the premartensitic state in the NiAl phase of a NiCoCrAlY bond coat during thermal cycling (2007)
Journal Article
Mendis, B., & Hemker, K. (2007). Evolution of the premartensitic state in the NiAl phase of a NiCoCrAlY bond coat during thermal cycling. Philosophical Magazine, 87, 4229-4251

Observations of reactive element gettering of sulfur in thermally grown oxide pegs (2006)
Journal Article
Mendis, B., Livi, K., & Hemker, K. (2006). Observations of reactive element gettering of sulfur in thermally grown oxide pegs. Scripta Materialia, 55(7), 589-592

Use of the Nye tensor in analyzing HREM images of bcc screw dislocations (2006)
Journal Article
Mendis, B., Mishin, Y., Hartley, C., & Hemker, K. (2006). Use of the Nye tensor in analyzing HREM images of bcc screw dislocations. Philosophical Magazine, 86(29-31), 4607-4640

Microstructural observations of as-prepared and thermal cycled NiCoCrAlY bond coats (2006)
Journal Article
Mendis, B., Tryon, B., Pollock, T., & Hemker, K. (2006). Microstructural observations of as-prepared and thermal cycled NiCoCrAlY bond coats. Surface and Coatings Technology, 201(7), 3918-3925

Suzuki segregation in a binary Cu-Si alloy (2004)
Journal Article
Mendis, B., Jones, I., & Smallman, R. (2004). Suzuki segregation in a binary Cu-Si alloy. Journal of electron microscopy, 53(4), 311-323