DS Gianola
Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films
Gianola, DS; Mendis, BG; Cheng, XM; Hemker, KJ
Citation
Gianola, D., Mendis, B., Cheng, X., & Hemker, K. (2008). Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films. Materials Science and Engineering: A, 483, 637-640
| Journal Article Type | Article |
|---|---|
| Publication Date | 2008 |
| Journal | Materials Science And Engineering A-structural Materials Properties Microstructure And Processing |
| Print ISSN | 0921-5093 |
| Publisher | Elsevier |
| Volume | 483 |
| Pages | 637-640 |
| Public URL | https://durham-repository.worktribe.com/output/1557379 |
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