Professor Buddhika Mendis b.g.mendis@durham.ac.uk
Professor
A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy
Mendis, BG; MacKenzie, M; Craven, AJ
Authors
M MacKenzie
AJ Craven
Citation
Mendis, B., MacKenzie, M., & Craven, A. (2010). A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), 105-117. https://doi.org/10.1016/j.ultramic.2009.09.013
| Journal Article Type | Article |
|---|---|
| Publication Date | 2010 |
| Journal | Ultramicroscopy |
| Print ISSN | 0304-3991 |
| Electronic ISSN | 1879-2723 |
| Publisher | Elsevier |
| Volume | 110 |
| Issue | 2 |
| Pages | 105-117 |
| DOI | https://doi.org/10.1016/j.ultramic.2009.09.013 |
| Public URL | https://durham-repository.worktribe.com/output/1522167 |
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