All Outputs (374)

Dependence of the critical thickness on Si doping of InGaAs on GaAs (2000)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158

The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles (2000)
Journal Article
Li Bassi, A., Bottani, C., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. The European Physical Journal C, 18, 31-38

Characterization Of Oxide Layers On Gaas Substrates (2000)
Journal Article
Allwood, D., Carline, R., Mason, N., Pickering, C., Tanner, B., & Walker, P. (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films, 364, 33-39

X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates (2000)
Journal Article
Su, Y., Du, C., Tanner, B., Hatton, P., Collins, S., Brown, S., …Cheong, S. (2000). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates

The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels (2000)
Journal Article
Makar, J., & Tanner, B. (2000). The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels. Journal of Magnetism and Magnetic Materials, 222, 291-304

Damage caused to interlayer coupling of magnetic multilayers by residual gases (2000)
Journal Article
Marrows, C., Hickey, B., Herrmann, M., McVitie, S., Chapman, J., Ormston, M., …Tanner, B. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Physical Review B, 61, 4131-4140

Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers (2000)
Journal Article
Hase, T., Pape, I., Read, D., Tanner, B., Dürr, H., Dudzik, E., …Hickey, B. (2000). Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers. Physical Review B, 61, 15331-15337

Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy (2000)
Journal Article
Ferrari, A., Libassi, A., Tanner, B., Stolojan, V., Yuan, J., Brown, L., …Robertson, J. (2000). Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy. Physical Review B, 62, 11089-11103

Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers (2000)
Journal Article
Hase, T., Pape, I., Tanner, B., Dürr, H., Dudzik, E., van der Laan, G., …Hickey, B. (2000). Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers. Physical Review B, 61, 3792-

Evaluation Of Polishing Damage In Alumina (2000)
Journal Article
Pape, I., Lawrence, C., Warren, P., Roberts, S., Briggs, G., Kolosov, O., …Tanner, B. (2000). Evaluation Of Polishing Damage In Alumina. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 80, 1913-1934. https://doi.org/10.1080/01418610008219094

Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity (2000)
Journal Article
Ferrari, A., Kleinsorge, B., Adamopoulos, G., Robertson, J., Milne, W., Stolojan, V., …Tanner, B. (2000). Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity. Journal of Non-Crystalline Solids, 266, 765-768

Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy (2000)
Journal Article
Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. MRS proceedings, 593, 293-298

X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields (2000)
Journal Article
Du, C., Lin, W., Su, Y., Tanner, B., Hatton, P., Casa, D., …Hohl, H. (2000). X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields. Journal of Physics: Condensed Matter, 12, 5361-5370

Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Moeck, P., Mizuno, K., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation. Japanese Journal of Applied Physics, 38, 3628-3631

Guest Editor's introduction (1999)
Journal Article
Tanner, B. (1999). Guest Editor's introduction. Journal of Physics D: Applied Physics, 32, A1-A2

High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy (1999)
Journal Article
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-

Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150

Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction (1999)
Journal Article
Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-

Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces (1999)
Journal Article
Pape, I., Tanner, B., & Wormington, M. (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal of Non-Crystalline Solids, 248, 75-83

Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity (1999)
Journal Article
Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of physics conference series, 161, 361-364