C.D. Moore
High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy
Moore, C.D.; Tanner, B.K.
Citation
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-
| Journal Article Type | Article |
|---|---|
| Publication Date | 1999 |
| Journal | "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences" |
| Print ISSN | 1364-503X |
| Electronic ISSN | 1471-2962 |
| Publisher | The Royal Society |
| Volume | 357 |
| Pages | 2801- |
| Public URL | https://durham-repository.worktribe.com/output/1611274 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1999RSPTA.357.2801M&db_key=GEN |
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