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High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy

Moore, C.D.; Tanner, B.K.

Authors

C.D. Moore



Citation

Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-

Journal Article Type Article
Publication Date 1999
Journal "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences"
Print ISSN 1364-503X
Electronic ISSN 1471-2962
Publisher The Royal Society
Volume 357
Pages 2801-
Public URL https://durham-repository.worktribe.com/output/1611274
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=1999RSPTA.357.2801M&db_key=GEN



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