Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.)
Journal Article
Banister, A., Lavender, I., Rawson, J., Clegg, W., Tanner, B., & Whitehead, R. (online). Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.). Journal of the Chemical Society. Dalton transactions, 1421-1429
All Outputs (374)
Modification Of Molecular Packing: Crystal Structures And Magnetic Properties Of Monomeric And Dimeric Difluorophenyl-1,2,3,5-dithiadiazolyl Radicals
Journal Article
Banister, A., Batsanov, A., Dawe, O., Herbertson, P., Howard, J., Lynn, S., May, I., Smith, J., Rawson, J., Rogers, T., Tanner, B., Antorrena, G., & Palacio, F. (online). Modification Of Molecular Packing: Crystal Structures And Magnetic Properties Of Monomeric And Dimeric Difluorophenyl-1,2,3,5-dithiadiazolyl Radicals. Journal of the Chemical Society. Dalton transactions, 2539-2541
X-ray Scattering For Semiconductor Characterisation
Journal Article
Tanner, B. (online). X-ray Scattering For Semiconductor Characterisation
X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates
Journal Article
Su, Y., Du, C., Tanner, B., Hatton, P., Collins, S., Brown, S., Paul, D., & Cheong, S. (online). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates
Dislocation Contrast In X-ray Section And Projection Topographs Of Elastically Deformed-crystals
Journal Article
Yang, P., Green, G., & Tanner, B. (online). Dislocation Contrast In X-ray Section And Projection Topographs Of Elastically Deformed-crystals. Institute of physics conference series, 467-471
Synthesis And Characterisation Of Three Group 10 Metal Dithiadiazolyl Complexes
Journal Article
Banister, A., Gorrell, I., Howard, J., Lawrence, S., Lehman, C., May, I., Rawson, J., Tanner, B., Gregory, C., Blake, A., & Fricker, S. (online). Synthesis And Characterisation Of Three Group 10 Metal Dithiadiazolyl Complexes. Journal of the Chemical Society. Dalton transactions, 377-384
Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques
Presentation / Conference Contribution
Gorji, N., Tanner, B., Vijayaraghavan, R., Danilewsky, A., & McNally, P. (2017, December). Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques. Presented at 2017 IEEE 67th Electronic Components and Technology Conference (ECTC)
In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers
Presentation / Conference Contribution
Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC
Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography
Presentation / Conference Contribution
Guo, J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC
Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale
Presentation / Conference Contribution
Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994, December). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. Presented at Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston
A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces
Presentation / Conference Contribution
Loxley, N., Monteiro, A., Cooke, M., Bowen, D., & Tanner, B. (1992, December). A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces. Presented at Symposium of Advanced III-V Compound Semiconductor Growth, Processing and Device., Boston
Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan
Presentation / Conference Contribution
Lafford, T., Parbrook, P., & Tanner, B. (2002, December). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. Presented at International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany
Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers
Presentation / Conference Contribution
Cockerton, S., Cooke, M., Bowen, D., & Tanner, B. (1996, December). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing II, Boston
New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction
Presentation / Conference Contribution
Loxley, N., Cockerton, S., Cooke, L., Gray, T., Tanner, B., & Bowen, D. (1994, December). New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing, Boston