M Wormington
Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale
Wormington, M; Sakurai, K; Bowen, DK; Tanner, BK
Authors
Contributors
M. Sarikaya
Editor
H.K. Wickramasinghe
Editor
M. Isaacson
Editor
Citation
Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994, December). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. Presented at Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy |
| Publication Date | 1994 |
| Volume | 332 |
| Pages | 525-530 |
| Series Title | Materials Research Society Symposium Proceedings. |
| Series ISSN | 0272-9172 |
| DOI | https://doi.org/10.1557/proc-332-525 |
| Public URL | https://durham-repository.worktribe.com/output/1680480 |
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