N Loxley
New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction
Loxley, N; Cockerton, S; Cooke, LM; Gray, T; Tanner, BK; Bowen, DK
Authors
Contributors
O.J. Glembocki
Editor
S.W. Pang
Editor
F.H. Pollak
Editor
G.M. Crean
Editor
G. Larrabee
Editor
Citation
Loxley, N., Cockerton, S., Cooke, L., Gray, T., Tanner, B., & Bowen, D. (1994, December). New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing, Boston
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | Symposium on Diagnostic Techniques for Semiconductor Materials Processing |
| Publication Date | 1994 |
| Volume | 324 |
| Pages | 451-456 |
| Series Title | Materials Research Society Symposium Proceedings |
| Series ISSN | 0272-9172 |
| Public URL | https://durham-repository.worktribe.com/output/1698087 |
You might also like
Trepidation or Precession: The Turning Point in a Tradition
(2023)
Book Chapter
“In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s
(2023)
Journal Article
Commentary on the model of the world machine
(2023)
Book Chapter
X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review
(2023)
Journal Article
A cooking pot lit by fire
(2023)
Journal Article