TA Lafford
Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan
Lafford, TA; Parbrook, PJ; Tanner, BK
Authors
Contributors
A. Hoffmann
Editor
A. Rizzi
Editor
Citation
Lafford, T., Parbrook, P., & Tanner, B. (2002, December). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. Presented at International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | International Workshop on Nitride Semiconductors (IWN 2002) |
| Publication Date | 2002 |
| Publisher | Wiley-VCH Verlag |
| Pages | 542-545 |
| Series Title | Proceedings of the International Workshop on Nitride Semiconductors |
| Public URL | https://durham-repository.worktribe.com/output/1680766 |
You might also like
Trepidation or Precession: The Turning Point in a Tradition
(2023)
Book Chapter
“In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s
(2023)
Journal Article
Commentary on the model of the world machine
(2023)
Book Chapter
X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review
(2023)
Journal Article
A cooking pot lit by fire
(2023)
Journal Article
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2025
Advanced Search