Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques
(2003)
Journal Article
Mai, Z., Luo, G., Liu, C., Li, M., Jiang, H., Lai, W., …K., B. (2003). Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199, 494-498
All Outputs (351)
Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy (2003)
Journal Article
Hase, T., Ho, E., Freijo, J., Thompson, S., Petford-Long, A., & Tanner, B. (2003). Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy. Journal of Physics D: Applied Physics, 36, A231-A235
Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N/AlN/GaN heterostructures (2003)
Journal Article
Lafford, T., Parbrook, P., & Tanner, B. (2003). Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures. Applied Physics Letters, 83(26), 5434-5436. https://doi.org/10.1063/1.1637717High-resolution x-ray diffraction, in surface symmetric, skew symmetric, and grazing incidence in-plane diffraction geometries, has been used to investigate the effect of an AlN interlayer between micron thick GaN and AlxGa1–xN layers grown by metalo... Read More about Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N/AlN/GaN heterostructures.
Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers (2003)
Journal Article
Hase, T., Buchanan, J., Tanner, B., Langridge, S., Dalgliesh, R., Foster, S., …Hickey, B. (2003). Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers. Journal of Applied Physics, 93(10), 6510-6512. https://doi.org/10.1063/1.1543876Electron scattering mechanisms within metallic multilayers are affected by both structural and magnetic disorders. Off-specular x-ray scattering has long been used to probe the structural interfaces, and it is only recently that it has been applied t... Read More about Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers.
Direct measurement of twist mosaic in epitaxial GaN. (2003)
Journal Article
Lafford, T., Ryan, P., Joyce, D., Goorsky, M., & Tanner, B. (2003). Direct measurement of twist mosaic in epitaxial GaN. physica status solidi (a) – applications and materials science, 195(1), 265-270. https://doi.org/10.1002/pssa.200306270The laboratory application of grazing incidence in-plane X-ray diffraction to the measurement of the in-plane (twist) mosaic of GaN epitaxial layers is demonstrated. Only a single measurement containing no extrapolation uncertainty is required. The r... Read More about Direct measurement of twist mosaic in epitaxial GaN..
Grazing Incidence In-plane Diffraction Measurement Of In-plane Mosaic With Microfocus X-ray Tubes (2002)
Journal Article
Goorsky, M., & Tanner, B. (2002). Grazing Incidence In-plane Diffraction Measurement Of In-plane Mosaic With Microfocus X-ray Tubes. Crystal Research and Technology, 37, 645-653
Elastic Constants And Structural Properties Of Nanometre-thick Diamond-like Carbon Films (2002)
Journal Article
Beghi, M., Ferrari, A., Bottani, C., Libassi, A., Tanner, B., Teo, K., & Robertson, J. (2002). Elastic Constants And Structural Properties Of Nanometre-thick Diamond-like Carbon Films. Diamond and Related Materials, 11, 1062-1067
Anomalously large intermixing in aluminum-transition-metal bilayers (2002)
Journal Article
Buchanan, J., Hase, T., Tanner, B., Chen, P., Gan, L., Powell, C., & Egelhoff, W. (2002). Anomalously large intermixing in aluminum-transition-metal bilayers. Physical Review B, 66, 104427-
Measurement Of The Elastic Constants Of Nanometer-thick Films (2002)
Journal Article
Beghi, M., Bottani, C., Bassi, A., Ossi, P., Tanner, B., Ferrari, A., & Robertson, J. (2002). Measurement Of The Elastic Constants Of Nanometer-thick Films. Materials Science and Engineering: C, 19, 201-204
Bonding and mechanical properties of ultrathin diamond-like carbon films (2002)
Journal Article
Beghi, M., Ferrari, A., Teo, K., Robertson, J., Bottani, C., Libassi, A., & Tanner, B. (2002). Bonding and mechanical properties of ultrathin diamond-like carbon films. Applied Physics Letters, 81, 3804-3806
Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors (2002)
Journal Article
Wilkins, S., Spencer, P., Hatton, P., Tanner, B., Lafford, T., Spence, J., & Loxley, N. (2002). Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors. Review of Scientific Instruments, 73(7), 2666-2671. https://doi.org/10.1063/1.1484240
Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions (2002)
Journal Article
Buchanan, J., Hase, T., Tanner, B., Hughes, N., & Hicken, R. (2002). Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions. Applied Physics Letters, 81(4), 751-753. https://doi.org/10.1063/1.1496131The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge... Read More about Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions.
Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films (2001)
Journal Article
Vaz, C., Lauhoff, G., Bland, J., Fulthorpe, B., Hase, T., Tanner, B., …Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials, 226, 1618-1620
Measurement Of The Elastic Constants Of Nanometric Films (2001)
Journal Article
Beghi, M., Bottani, C., Bassi, A., Tanner, B., Ferrari, A., Teo, K., & Robertson, J. (2001). Measurement Of The Elastic Constants Of Nanometric Films. Proceedings of SPIE, 4449, 119-130
X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers (2001)
Journal Article
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1728-1729
Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers (2001)
Journal Article
Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1717-1719
Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina (2001)
Journal Article
Tanner, B., Hase, T., & Wu, H. (2001). Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina. Philosophical Magazine Letters, 81, 351-355
In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs (2001)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D: Applied Physics, 34, A109-A113
Brillouin Scattering Investigation Of Melting In Sn Nanoparticles (2001)
Journal Article
Bottani, C., Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2001). Brillouin Scattering Investigation Of Melting In Sn Nanoparticles. Materials Science and Engineering: C, 15, 41-43
High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers (2001)
Journal Article
Fulthorpe, B., Ryan, P., Hase, T., Tanner, B., & Hickey, B. (2001). High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers. Journal of Physics D: Applied Physics, 34, A203-A207