Effect Of Interface Structure On The X-ray Double Crystal Rocking Curve Peak Position From Very Thin-layers In The Highly Asymmetric Bragg Geometry
(1990)
Journal Article
Cockerton, S., Miles, S., Green, G., & Tanner, B. (1990). Effect Of Interface Structure On The X-ray Double Crystal Rocking Curve Peak Position From Very Thin-layers In The Highly Asymmetric Bragg Geometry. Journal of Crystal Growth, 99, 1324-1328
Outputs (8)
Computer simulations of indications in magnetic particle inspection (1990)
Journal Article
McCoy, J., & Tanner, B. (1990). Computer simulations of indications in magnetic particle inspection. Journal of Physics D: Applied Physics, 23, 593-599
Nucleation Of Misfit Dislocations In Strained-layer Ingaas On Gaas (1990)
Journal Article
Green, G., Tanner, B., Barnett, S., Emeny, M., Pitt, A., Whitehouse, C., & Clark, G. (1990). Nucleation Of Misfit Dislocations In Strained-layer Ingaas On Gaas. Philosophical Magazine Letters, 62, 131-137
The magnetic properties of plastically deformed steels (1990)
Journal Article
Thompson, S., & Tanner, B. (1990). The magnetic properties of plastically deformed steels. Journal of Magnetism and Magnetic Materials, 83, 221-222
Magnetic-properties Of Welds In High-strength Pearlitic Steels (1990)
Journal Article
Thompson, S., Allen, P., & Tanner, B. (1990). Magnetic-properties Of Welds In High-strength Pearlitic Steels. IEEE Transactions on Magnetics, 26, 1984-1986
Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals (1990)
Journal Article
Alourfi, M., & Tanner, B. (1990). Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals. Journal of Crystal Growth, 99, 139-144
High-resolution X-ray-diffraction And Topography For Crystal Characterization (1990)
Journal Article
Tanner, B. (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal of Crystal Growth, 99, 1315-1323
Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. (1990)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS proceedings, 208, 119-124. https://doi.org/10.1557/proc-208-119A new desk-side double-axis X-ray diffractometer capable of rapid, automatic measurement of lattice mismatch between epitaxial thin films and substrate in a two dimensional grid 150 mm square has been built. The design principles behind the five inde... Read More about Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization..