Professor Brian Tanner b.k.tanner@durham.ac.uk
Emeritus Professor
High-resolution X-ray-diffraction And Topography For Crystal Characterization
Tanner, BK
Authors
Citation
Tanner, B. (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal of Crystal Growth, 99, 1315-1323
| Journal Article Type | Article |
|---|---|
| Publication Date | 1990 |
| Journal | Journal of Crystal Growth |
| Print ISSN | 0022-0248 |
| Publisher | Elsevier |
| Volume | 99 |
| Pages | 1315-1323 |
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