Measurement Of The Elastic Constants Of Nanometric Films
(2001)
Journal Article
Beghi, M., Bottani, C., Bassi, A., Tanner, B., Ferrari, A., Teo, K., & Robertson, J. (2001). Measurement Of The Elastic Constants Of Nanometric Films. Proceedings of SPIE, 4449, 119-130
Outputs (13)
Brillouin Scattering Investigation Of Melting In Sn Nanoparticles (2001)
Journal Article
Bottani, C., Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2001). Brillouin Scattering Investigation Of Melting In Sn Nanoparticles. Materials Science and Engineering: C, 15, 41-43
X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers (2001)
Journal Article
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1728-1729
Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films (2001)
Journal Article
Vaz, C., Lauhoff, G., Bland, J., Fulthorpe, B., Hase, T., Tanner, B., …Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials, 226, 1618-1620
In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs (2001)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D: Applied Physics, 34, A109-A113
Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers (2001)
Journal Article
Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B, 64, 245404-
Kinetics Of Native Oxide Film Growth On Epiready Gaas (2001)
Journal Article
Tanner, B., Allwood, D., & Mason, N. (2001). Kinetics Of Native Oxide Film Growth On Epiready Gaas. Materials Science and Engineering: B, 80, 99-103
Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina (2001)
Journal Article
Tanner, B., Hase, T., & Wu, H. (2001). Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina. Philosophical Magazine Letters, 81, 351-355
Structural and magnetic changes on annealing permalloy/copper multilayers (2001)
Journal Article
Fulthorpe, B., Hase, T., Tanner, B., Marrows, C., & Hickey, B. (2001). Structural and magnetic changes on annealing permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1733-1734
Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers (2001)
Journal Article
Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1717-1719