High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films
(1993)
Journal Article
Tanner, B., Hallam, T., Funaki, M., & Brinkman, A. (1993). High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films. MRS proceedings, 280, 635-640
Outputs (15)
X-ray topography studies of the defect depth profile in processed silicon wafers (1993)
Journal Article
Halfpenny, P., Green, G., & Tanner, B. (1993). X-ray topography studies of the defect depth profile in processed silicon wafers. Journal of Physics D: Applied Physics, 26, A65-A68
Contrast of device structures in X-ray section topographs (1993)
Journal Article
Holland, A., & Tanner, B. (1993). Contrast of device structures in X-ray section topographs. Journal of Physics D: Applied Physics, 26, A137-A141
The magnetic properties of pearlitic steels as a function of carbon content (1993)
Journal Article
Thompson, S., & Tanner, B. (1993). The magnetic properties of pearlitic steels as a function of carbon content. Journal of Magnetism and Magnetic Materials, 123, 283-298
Characterization of engineering surfaces by grazing-incidence X-ray reflectivity (1993)
Journal Article
Bowen, D., & Tanner, B. (1993). Characterization of engineering surfaces by grazing-incidence X-ray reflectivity. Nanotechnology, 4, 175-182
Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process (1993)
Journal Article
Funaki, M., Brinkman, A., Hallam, T., & Tanner, B. (1993). Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process. Applied Physics Letters, 62, 2983-2985
X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films (1993)
Journal Article
Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., …Tanner, B. (1993). X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films. Journal of Physics D: Applied Physics, 26, 161-
X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth (1993)
Journal Article
Barnett, S., Whitehouse, C., Keir, A., Clark, G., Usher, B., Tanner, B., …Johnson, A. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D: Applied Physics, 26, A45-A49
X-ray scattering from multiple-layer structures forming Bragg-case interferometers (1993)
Journal Article
Tanner, B. (1993). X-ray scattering from multiple-layer structures forming Bragg-case interferometers. Journal of Physics D: Applied Physics, 26, A151-A155
Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials (1993)
Journal Article
Tanner, B., & Bowen, D. (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal of Crystal Growth, 126, 1-18