Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials
Tanner, BK; Bowen, DK
Authors
DK Bowen
Citation
Tanner, B., & Bowen, D. (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal of Crystal Growth, 126, 1-18
| Journal Article Type | Article |
|---|---|
| Publication Date | 1993 |
| Journal | Journal of Crystal Growth |
| Print ISSN | 0022-0248 |
| Electronic ISSN | 1873-5002 |
| Publisher | Elsevier |
| Volume | 126 |
| Pages | 1-18 |
| Public URL | https://durham-repository.worktribe.com/output/1612052 |
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