Skip to main content

Research Repository

Advanced Search

Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials

Tanner, BK; Bowen, DK

Authors

DK Bowen



Citation

Tanner, B., & Bowen, D. (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal of Crystal Growth, 126, 1-18

Journal Article Type Article
Publication Date 1993
Journal Journal of Crystal Growth
Print ISSN 0022-0248
Publisher Elsevier
Volume 126
Pages 1-18