Measurement of aluminum concentration in epitaxial layers of Al<SUB>x</SUB>Ga<SUB>1 - x</SUB>As on GaAs by double axis x-ray diffractometry
(1991)
Journal Article
Tanner, B., Turnbull, A., Stanley, C., Kean, A., & McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of AlxGa1 - xAs on GaAs by double axis x-ray diffractometry. Applied Physics Letters, 59, 2272-2274
High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Li, H., Yi, H., & Wang, R. (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films
Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer (1991)
Journal Article
Green, G., Tanner, B., & Kightley, P. (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer
Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds (1991)
Journal Article
Turnbull, A., Green, G., Tanner, B., & Halliwell, M. (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds
Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films (1991)
Journal Article
Bowen, D., Loxley, N., Tanner, B., Cooke, L., & Capano, M. (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films
Structural analysis of high-T<SUB>c</SUB> epitaxial GdBa₂Cu₃O<SUB>7-x</SUB> superconducting thin films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Cui, S., Mai, Z., Li, H., …Wang, R. (1991). Structural analysis of high-Tc epitaxial GdBa₂Cu₃O7-x superconducting thin films
Dislocation Images In X-ray Section Topographs Of Curved Crystals (1991)
Journal Article
Green, G., Loxley, N., & Tanner, B. (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal of Applied Crystallography, 24, 304-311
Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers (1991)
Journal Article
Green, G., Tanner, B., Turnbull, A., Barnett, S., Emeny, M., & Whitehouse, C. (1991). Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers
The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers (1991)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1991). The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers
X-ray Reflectometry From Semiconductor Surfaces And Interfaces (1991)
Journal Article
Tanner, B., Miles, S., Bowen, D., Hart, L., & Loxley, N. (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces
X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon (1991)
Journal Article
Holland, A., Green, G., Tanner, B., & Mai, Z. (1991). X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon
STRUCTURAL CHARACTERIZATION OF POLYANILINE FREE STANDING FILMS (1991)
Journal Article
Monkman, A., & Adams, P. (1991). STRUCTURAL CHARACTERIZATION OF POLYANILINE FREE STANDING FILMS. Synthetic Metals, 41(3), 891-896Free standing films of polyaniline in its emeraldine base form have been cast from N-methyl-2-pyrrolidone solution. These films have been characterised via FTIR and solid state C-13 NMR to unambiguously reveal the chain structure of the emeraldine. T... Read More about STRUCTURAL CHARACTERIZATION OF POLYANILINE FREE STANDING FILMS.
X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATIONS OF THE CHAIN STRUCTURE AND DOPING MECHANISMS IN POLYANILINE (1991)
Journal Article
Monkman, A., Stevens, G., & Bloor, D. (1991). X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATIONS OF THE CHAIN STRUCTURE AND DOPING MECHANISMS IN POLYANILINE. Journal of Physics D: Applied Physics, 24(5), 738-749X-ray photoelectron spectroscopy has been used to investigate the atomic species, and their bonding, within the conductive polymer polyaniline (PANi). PANi was grown electrochemically using HCl as the electrolyte ion and all three of PANi's oxidation... Read More about X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATIONS OF THE CHAIN STRUCTURE AND DOPING MECHANISMS IN POLYANILINE.
STRETCH ALIGNED POLYANILINE FILMS (1991)
Journal Article
Monkman, A., & Adams, P. (1991). STRETCH ALIGNED POLYANILINE FILMS. Solid State Communications, 78(1), 29-31We have measured optical and electrical anisotropy in uniaxially stretch aligned polyaniline films. Free standing films of polyaniline cast from N-methyl-pyrrolidone solution have been elongated by up to a maximum 650%, to yield conductivities up to... Read More about STRETCH ALIGNED POLYANILINE FILMS.
OBSERVED ANISOTROPIES IN STRETCH ORIENTED POLYANILINE (1991)
Journal Article
Monkman, A., & Adams, P. (1991). OBSERVED ANISOTROPIES IN STRETCH ORIENTED POLYANILINE. Synthetic Metals, 41(1-2), 627-633Free standing films of the emeraldine base form of polyaniline have been oriented via the application of uniaxial stress. The films have been elongated to a maximum of 650%. When doped with hydrochloric acid such oriented films show conductivities up... Read More about OBSERVED ANISOTROPIES IN STRETCH ORIENTED POLYANILINE.
ENERGY-TRANSFER KINETICS IN THE GREEN BACTERIUM CHLOROFLEXUS-AURANTIACUS (1991)
Journal Article
Palsson, L., Miller, M., & Gillbro, T. (1991). ENERGY-TRANSFER KINETICS IN THE GREEN BACTERIUM CHLOROFLEXUS-AURANTIACUS
OPTICAL AND ELECTRONIC-PROPERTIES OF STRETCH-ORIENTED SOLUTION-CAST POLYANILINE FILMS (1991)
Journal Article
Monkman, A., & Adams, P. (1991). OPTICAL AND ELECTRONIC-PROPERTIES OF STRETCH-ORIENTED SOLUTION-CAST POLYANILINE FILMS. Synthetic Metals, 40(1), 87-96We have prepared and characterized polyaniline in the form of thin free-standing films and films formed by spin coating. The films are formed from solution with chemically prepared base polyaniline (emeraldine) which is dissolved in N-methyl-2-pyrrol... Read More about OPTICAL AND ELECTRONIC-PROPERTIES OF STRETCH-ORIENTED SOLUTION-CAST POLYANILINE FILMS.