Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
X-ray Reflectometry From Semiconductor Surfaces And Interfaces
Tanner, BK; Miles, SJ; Bowen, DK; Hart, L; Loxley, N
Authors
SJ Miles
DK Bowen
L Hart
N Loxley
Citation
Tanner, B., Miles, S., Bowen, D., Hart, L., & Loxley, N. (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces
| Journal Article Type | Article |
|---|---|
| Publication Date | 1991 |
| Journal | Advances In Surface And Thin Film Diffraction |
| Volume | 208 |
| Pages | 345-350 |
| Public URL | https://durham-repository.worktribe.com/output/1579910 |
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