Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer (2010)
Journal Article
Abes, M., Atkinson, D., Tanner, B., Charlton, T., Langridge, S., Hase, T., …Lebegue, S. (2010). Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer. Physical review B, 82(18), Article 184412. https://doi.org/10.1103/physrevb.82.184412

Using the surface, interface, and element specificity of x-ray resonant magnetic scattering in combination with x-ray magnetic circular dichroism, we have spatially resolved the magnetic spin polarization, and the associated interface proximity effec... Read More about Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer.

Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers (2010)
Journal Article
Fan, R., Kinane, C., Charlton, T., Dorner, R., Ali, M., de Vries, M., …Langridge, S. (2010). Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers. Physical review B, 82(18), Article 184418. https://doi.org/10.1103/physrevb.82.184418

The nanoscale magnetic structure of FeRh epilayers has been studied by polarized neutron reflectometry. Epitaxial films with a nominal thickness of 500 Å were grown on MgO (001) substrates via molecular-beam epitaxy and capped with 20 Å of MgO. The F... Read More about Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers.

Dislocation sources and slip band nucleation from indents on silicon wafers (2010)
Journal Article
Wittge, J., Danilewsky, A., Allen, D., McNally, P., Li, Z., Baumbach, T., …Tanner, B. (2010). Dislocation sources and slip band nucleation from indents on silicon wafers. Journal of Applied Crystallography, 43(5), 1036-1039. https://doi.org/10.1107/s0021889810029894

X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers (2010)
Journal Article
Wittge, J., Danilewsky, A., Allen, D., McNally, P., Li, Z., Baumbach, T., …Tanner, B. (2010). X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers. Powder Diffraction, 25(2), 99-103. https://doi.org/10.1154/1.3392369

Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing (2010)
Journal Article
Pym, A., Ruhrig, M., & Tanner, B. (2010). Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing. Journal of Applied Physics, 107(9), Article 093524. https://doi.org/10.1063/1.3366707

Sputtered multilayers of Co0.6Fe0.2B0.2 and AlOx have been measured using grazing incidence x-ray scattering to determine the changes in layer and interface structure during in situ annealing. We confirm our earlier deduction of a sharpening of the i... Read More about Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing.