Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction (1999)
Journal Article
Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-

Influence of step-bunching on grazing incidence diffuse x-ray scattering (1999)
Journal Article
Clarke, J., Pape, I., Tanner, B., & Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of Physics: Condensed Matter, 11, 2661-2668

Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity (1999)
Journal Article
Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of physics conference series, 161, 361-364

Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150

High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy (1999)
Journal Article
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-

Guest Editor's introduction (1999)
Journal Article
Tanner, B. (1999). Guest Editor's introduction. Journal of Physics D: Applied Physics, 32, A1-A2

Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Moeck, P., Mizuno, K., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation. Japanese Journal of Applied Physics, 38, 3628-3631

The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films (1999)
Journal Article
Fulthorpe, B., Joyce, D., Hase, T., Rozatian, A., Tanner, B., & Grundy, P. (1999). The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films. Journal of Physics: Condensed Matter, 11, 8477-8487

X-ray optics of in situ synchrotron topography of InGaAs on GaAs (1999)
Journal Article
Tanner, B., Keir, A., Möck, P., Whitehouse, C., Lacey, G., Johnson, A., …Clark, G. (1999). X-ray optics of in situ synchrotron topography of InGaAs on GaAs. Journal of Physics D: Applied Physics, 32, A119-A122

Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. (1999)
Journal Article
Bowen, D., & Tanner, B. (1999). Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2629-

Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers (1999)
Journal Article
Marrows, C., Wiser, N., Hickey, B., Hase, T., & Tanner, B. (1999). Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers. Journal of Physics: Condensed Matter, 11, 81-88

The effect of conformal roughness on spin-valves (1999)
Journal Article
Clarke, J., Marrows, C., Stanley, F., Bunyan, R., Tanner, B., & Hickey, B. (1999). The effect of conformal roughness on spin-valves. Journal of Physics D: Applied Physics, 32, 1169-1174

X-ray Characterisation Of Indium Phosphide Substrates (1999)
Journal Article
Moore, C., & Tanner, B. (1999). X-ray Characterisation Of Indium Phosphide Substrates. Materials Science and Engineering: B, 66, 11-14

Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy (1999)
Journal Article
Mock, P., Fukuzawa, M., Laczik, Z., Smith, G., Booker, G., Yamada, M., …Tanner, B. (1999). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Institute of physics conference series, 67-72

Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces (1999)
Journal Article
Pape, I., Tanner, B., & Wormington, M. (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal of Non-Crystalline Solids, 248, 75-83

Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique (1999)
Journal Article
Aitken, N., Potter, M., Buckley, D., Mullins, J., Carles, J., Halliday, D., …Brinkman, A. (1999). Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique. Journal of Crystal Growth, 199, 984-987. https://doi.org/10.1016/s0022-0248%2898%2901138-5