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Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy

Mock, P; Fukuzawa, M; Laczik, Z; Smith, GW; Booker, GR; Yamada, M; Herms, M; Tanner, BK

Authors

P Mock

M Fukuzawa

Z Laczik

GW Smith

GR Booker

M Yamada

M Herms



Citation

Mock, P., Fukuzawa, M., Laczik, Z., Smith, G., Booker, G., Yamada, M., Herms, M., & Tanner, B. (online). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Institute of physics conference series, 67-72

Journal Article Type Article
Journal Institute of physics conference series.
Print ISSN 0951-3248
Electronic ISSN 2154-6630
Publisher IOP Publishing
Pages 67-72
Public URL https://durham-repository.worktribe.com/output/1580662



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