Damage caused to interlayer coupling of magnetic multilayers by residual gases (2000)
Journal Article
Marrows, C., Hickey, B., Herrmann, M., McVitie, S., Chapman, J., Ormston, M., …Tanner, B. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Physical Review B, 61, 4131-4140

Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy (2000)
Journal Article
Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Diamond and Related Materials, 9, 771-776

X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields (2000)
Journal Article
Du, C., Lin, W., Su, Y., Tanner, B., Hatton, P., Casa, D., …Hohl, H. (2000). X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields. Journal of Physics: Condensed Matter, 12, 5361-5370

Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy (2000)
Journal Article
Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. MRS proceedings, 593, 293-298

Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity (2000)
Journal Article
Ferrari, A., Kleinsorge, B., Adamopoulos, G., Robertson, J., Milne, W., Stolojan, V., …Tanner, B. (2000). Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity. Journal of Non-Crystalline Solids, 266, 765-768

Evaluation Of Polishing Damage In Alumina (2000)
Journal Article
Pape, I., Lawrence, C., Warren, P., Roberts, S., Briggs, G., Kolosov, O., …Tanner, B. (2000). Evaluation Of Polishing Damage In Alumina. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 80, 1913-1934. https://doi.org/10.1080/01418610008219094

Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers (2000)
Journal Article
Hase, T., Pape, I., Tanner, B., Dürr, H., Dudzik, E., van der Laan, G., …Hickey, B. (2000). Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers. Physical Review B, 61, 3792-

Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy (2000)
Journal Article
Ferrari, A., Libassi, A., Tanner, B., Stolojan, V., Yuan, J., Brown, L., …Robertson, J. (2000). Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy. Physical Review B, 62, 11089-11103

Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers (2000)
Journal Article
Hase, T., Pape, I., Read, D., Tanner, B., Dürr, H., Dudzik, E., …Hickey, B. (2000). Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers. Physical Review B, 61, 15331-15337

The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels (2000)
Journal Article
Makar, J., & Tanner, B. (2000). The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels. Journal of Magnetism and Magnetic Materials, 222, 291-304

Guest Editor's introduction (1999)
Journal Article
Tanner, B. (1999). Guest Editor's introduction. Journal of Physics D: Applied Physics, 32, A1-A2

Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction (1999)
Journal Article
Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-

Influence of step-bunching on grazing incidence diffuse x-ray scattering (1999)
Journal Article
Clarke, J., Pape, I., Tanner, B., & Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of Physics: Condensed Matter, 11, 2661-2668

Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity (1999)
Journal Article
Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of physics conference series, 161, 361-364

Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150

High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy (1999)
Journal Article
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-

Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces (1999)
Journal Article
Pape, I., Tanner, B., & Wormington, M. (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal of Non-Crystalline Solids, 248, 75-83

X-ray Characterisation Of Indium Phosphide Substrates (1999)
Journal Article
Moore, C., & Tanner, B. (1999). X-ray Characterisation Of Indium Phosphide Substrates. Materials Science and Engineering: B, 66, 11-14

Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy (1999)
Journal Article
Mock, P., Fukuzawa, M., Laczik, Z., Smith, G., Booker, G., Yamada, M., …Tanner, B. (1999). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Institute of physics conference series, 67-72

The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films (1999)
Journal Article
Fulthorpe, B., Joyce, D., Hase, T., Rozatian, A., Tanner, B., & Grundy, P. (1999). The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films. Journal of Physics: Condensed Matter, 11, 8477-8487