Brian Tanner's Outputs (15)

X-ray scattering and topography studies of Hg<SUB>1-x</SUB>Mn<SUB>x</SUB>Te epitaxial films (1993)
Journal Article
Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., …Tanner, B. (1993). X-ray scattering and topography studies of Hg1-xMnxTe epitaxial films. Journal of Physics D: Applied Physics, 26, A161-A166

The MOVPE growth and characterization of Hg<SUB>1-x</SUB>Mn<SUB>x</SUB>Te (1993)
Journal Article
Funaki, M., Lewis, J., Hallam, T., Li, C., Halder, S., Brinkman, A., & Tanner, B. (1993). The MOVPE growth and characterization of Hg1-xMnxTe. Semiconductor Science and Technology, 8, 200-

Measurement of inter-particle interactions in a single magnetic ink aggregate (1993)
Journal Article
Westwood, S., Lewis, V., O'Grady, K., & Tanner, B. (1993). Measurement of inter-particle interactions in a single magnetic ink aggregate. Journal of Magnetism and Magnetic Materials, 125, L247-L250

Simulation of dislocation images in Bragg-case double-crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductors (1993)
Journal Article
Cottrell, S., Spirkl, W., & Tanner, B. (1993). Simulation of dislocation images in Bragg-case double-crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductors. Journal of Physics D: Applied Physics, 26, A126-A130

In-situ Synchrotron X-ray Studies Of Epitaxial Strained-layer Growth-processes (1993)
Journal Article
Whitehouse, C., Barnett, S., Usher, B., Cullis, A., Keir, A., Johnson, A., Clark, G., Tanner, B., Spirkl, W., Lunn, B., Hagston, W., & Hogg, J. (1993). In-situ Synchrotron X-ray Studies Of Epitaxial Strained-layer Growth-processes. Institute of physics conference series, 563-568

Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials (1993)
Journal Article
Tanner, B., & Bowen, D. (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal of Crystal Growth, 126, 1-18

X-ray scattering from multiple-layer structures forming Bragg-case interferometers (1993)
Journal Article
Tanner, B. (1993). X-ray scattering from multiple-layer structures forming Bragg-case interferometers. Journal of Physics D: Applied Physics, 26, A151-A155

X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth (1993)
Journal Article
Barnett, S., Whitehouse, C., Keir, A., Clark, G., Usher, B., Tanner, B., …Johnson, A. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D: Applied Physics, 26, A45-A49

X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films (1993)
Journal Article
Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., …Tanner, B. (1993). X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films. Journal of Physics D: Applied Physics, 26, 161-

Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process (1993)
Journal Article
Funaki, M., Brinkman, A., Hallam, T., & Tanner, B. (1993). Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process. Applied Physics Letters, 62, 2983-2985

Characterization of engineering surfaces by grazing-incidence X-ray reflectivity (1993)
Journal Article
Bowen, D., & Tanner, B. (1993). Characterization of engineering surfaces by grazing-incidence X-ray reflectivity. Nanotechnology, 4, 175-182

The magnetic properties of pearlitic steels as a function of carbon content (1993)
Journal Article
Thompson, S., & Tanner, B. (1993). The magnetic properties of pearlitic steels as a function of carbon content. Journal of Magnetism and Magnetic Materials, 123, 283-298

Contrast of device structures in X-ray section topographs (1993)
Journal Article
Holland, A., & Tanner, B. (1993). Contrast of device structures in X-ray section topographs. Journal of Physics D: Applied Physics, 26, A137-A141

X-ray topography studies of the defect depth profile in processed silicon wafers (1993)
Journal Article
Halfpenny, P., Green, G., & Tanner, B. (1993). X-ray topography studies of the defect depth profile in processed silicon wafers. Journal of Physics D: Applied Physics, 26, A65-A68

High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films (1993)
Journal Article
Tanner, B., Hallam, T., Funaki, M., & Brinkman, A. (1993). High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films. MRS proceedings, 280, 635-640