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The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers (2005)
Journal Article
Pym, A. T. G., Rozatian, A. S. H., Marrows, C. H., Brown, S. D., Bouchenoire, L., Hase, T. P. A., & Tanner, B. K. (2005). The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers. Journal of Physics D: Applied Physics, 38, A190-A194. http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2005JPhD...38A.190P&db_key=PHY

Influence Of Molecular Weight On The Surface Morphology Of Aligned, Branched Side-chain Polyfluorene (2005)
Journal Article
Knaapila, M., Lyons, B., Hase, T., Pearson, C., Petty, M., Bouchenoire, L., …Monkman, A. (2005). Influence Of Molecular Weight On The Surface Morphology Of Aligned, Branched Side-chain Polyfluorene. Advanced Functional Materials, 15(9), 1517-1522. https://doi.org/10.1002/adfm.200500061

The surface structure of uniaxially aligned poly(9,9-bis(ethylhexyl)-fluorene-2,7-diyl) films on rubbed polyimide has been studied as a function of molecular weight (Mn = 3-150 kg mol-1, number-average molecular weight) using polarized microscopy, at... Read More about Influence Of Molecular Weight On The Surface Morphology Of Aligned, Branched Side-chain Polyfluorene.

Characterization Of Thin Film Cadmium Sulfide Grown Using A Modified Chemical Bath Deposition Process (2005)
Presentation / Conference Contribution
Archbold, M., Halliday, D., Durose, K., Hase, T., Smyth-boyle, D., & Govender, K. (2005). Characterization Of Thin Film Cadmium Sulfide Grown Using A Modified Chemical Bath Deposition Process. Conference Record of the Thirty-first IEEE Photovoltaic Specialists Conference, 2005. (pp. 476-479). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/pvsc.2005.1488173

Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy (2003)
Journal Article
Hase, T. P. A., Ho, E. M., Freijo, J.-J., Thompson, S. M., Petford-Long, A. K., & Tanner, B. K. (2003). Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy. Journal of Physics D: Applied Physics, 36, A231-A235. http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2003JPhD...36A.231H&db_key=PHY

Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques (2003)
Journal Article
Mai, Z. H., Luo, G. M., Liu, C. X., Li, M. H., Jiang, H. W., Lai, W. Y., Wang, J., Ding, Y. F., Hase, T. P. A., Fulthorpe, B. D., Tanner, ,., & K., B. (2003). Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 199, 494-498. http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2003NIMPB.199..494M&db_key=PHY

Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers (2003)
Journal Article
Hase, T. P. A., Buchanan, J. D. R., Tanner, B. K., Langridge, S., Dalgliesh, R. M., Foster, S., Marrows, C. H., & Hickey, B. J. (2003). Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers. Journal of Applied Physics, 93(10), 6510-6512. https://doi.org/10.1063/1.1543876

Electron scattering mechanisms within metallic multilayers are affected by both structural and magnetic disorders. Off-specular x-ray scattering has long been used to probe the structural interfaces, and it is only recently that it has been applied t... Read More about Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers.