J.D.R. Buchanan
Interface intermixing and in-plane grain size in aluminum transition-metal bilayers
Buchanan, J.D.R.; Hase, T.P.A.; Tanner, B.K.; Powell, C.J.; Egelhoff, W.F. Jr
Authors
T.P.A. Hase
Brian Tanner b.k.tanner@durham.ac.uk
Conducting Exam Musician
C.J. Powell
W.F. Jr Egelhoff
Citation
Buchanan, J., Hase, T., Tanner, B., Powell, C., & Egelhoff, W. J. (2004). Interface intermixing and in-plane grain size in aluminum transition-metal bilayers. Journal of Applied Physics, 96, 7278-7282
| Journal Article Type | Article |
|---|---|
| Publication Date | 2004 |
| Journal | Journal of Applied Physics |
| Print ISSN | 0021-8979 |
| Electronic ISSN | 1089-7550 |
| Publisher | American Institute of Physics |
| Volume | 96 |
| Pages | 7278-7282 |
| Public URL | https://durham-repository.worktribe.com/output/1588104 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2004JAP....96.7278B&db_key=PHY |
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