A.T.G. Pym
The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers
Pym, A.T.G.; Rozatian, A.S.H.; Marrows, C.H.; Brown, S.D.; Bouchenoire, L.; Hase, T.P.A.; Tanner, B.K.
Authors
A.S.H. Rozatian
C.H. Marrows
S.D. Brown
L. Bouchenoire
T.P.A. Hase
B.K. Tanner
Citation
Pym, A., Rozatian, A., Marrows, C., Brown, S., Bouchenoire, L., Hase, T., & Tanner, B. (2005). The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers. Journal of Physics D: Applied Physics, 38, A190-A194
| Journal Article Type | Article |
|---|---|
| Publication Date | 2005 |
| Journal | Journal of Physics D Applied Physics |
| Print ISSN | 0022-3727 |
| Publisher | IOP Publishing |
| Volume | 38 |
| Pages | A190-A194 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2005JPhD...38A.190P&db_key=PHY |
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