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The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers

Pym, A.T.G.; Rozatian, A.S.H.; Marrows, C.H.; Brown, S.D.; Bouchenoire, L.; Hase, T.P.A.; Tanner, B.K.

Authors

A.T.G. Pym

A.S.H. Rozatian

C.H. Marrows

S.D. Brown

L. Bouchenoire

T.P.A. Hase



Citation

Pym, A., Rozatian, A., Marrows, C., Brown, S., Bouchenoire, L., Hase, T., & Tanner, B. (2005). The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers. Journal of Physics D: Applied Physics, 38, A190-A194

Journal Article Type Article
Publication Date 2005
Journal Journal of Physics D Applied Physics
Print ISSN 0022-3727
Publisher IOP Publishing
Volume 38
Pages A190-A194
Publisher URL http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2005JPhD...38A.190P&db_key=PHY


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