X.S. Wu
Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature
Wu, X.S.; Hase, T.P.A.; Tanner, B.K.; Cheng, H.H.
Citation
Wu, X., Hase, T., Tanner, B., & Cheng, H. (2004). Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature. Surface Science, 548, 239-245
| Journal Article Type | Article |
|---|---|
| Publication Date | 2004 |
| Journal | Surface Science |
| Print ISSN | 0039-6028 |
| Electronic ISSN | 1879-2758 |
| Publisher | Elsevier |
| Volume | 548 |
| Pages | 239-245 |
| Public URL | https://durham-repository.worktribe.com/output/1588085 |
| Publisher URL | http://adsabs.harvard.edu/cgi-bin/nph-bib_query?bibcode=2004SurSc.548..239W&db_key=PHY |
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