All Outputs (351)

Time-dependent magnetization in the 1D spin glass Fe₂TiO₅ (1992)
Journal Article
Tanner, B., Pilkington, C., & Wanklyn, B. (1992). Time-dependent magnetization in the 1D spin glass Fe₂TiO₅. Journal of Magnetism and Magnetic Materials, 104, 1611-1612

Grazing-incidence X-ray Reflectometry Studies Of Cadmium Arachidate Langmuir-blodgett-films (1992)
Journal Article
Tanner, B., Bowen, D., Petty, M., Swaminathan, S., & Grunfeld, F. (1992). Grazing-incidence X-ray Reflectometry Studies Of Cadmium Arachidate Langmuir-blodgett-films

Characterization Of Magnetic Multilayers By Grazing-incidence X-ray Reflectivity (1992)
Journal Article
Tanner, B., & Hudson, J. (1992). Characterization Of Magnetic Multilayers By Grazing-incidence X-ray Reflectivity. IEEE Transactions on Magnetics, 28, 2736-2741

Internal magnetic domain structure changes in thick TbAl₂ crystals revealed by polarized neutron topography (1992)
Journal Article
Tanner, B., Baruchel, J., & Abell, J. (1992). Internal magnetic domain structure changes in thick TbAl₂ crystals revealed by polarized neutron topography. Journal of Magnetism and Magnetic Materials, 104, 317-318

Principles And Performance Of A Pc-based Program For Simulation Of Grazing-incidence X-ray Reflectivity Profiles (1992)
Journal Article
Wormington, M., Bowen, D., & Tanner, B. (1992). Principles And Performance Of A Pc-based Program For Simulation Of Grazing-incidence X-ray Reflectivity Profiles

Small-angle X-ray scattering study of ferrofluids (1992)
Journal Article
Bissell, P., Chantrell, R., Hoon, S., Lambrick, D., & Tanner, B. (1992). Small-angle X-ray scattering study of ferrofluids. Journal of Magnetism and Magnetic Materials, 104, 1551-1552

X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon (1991)
Journal Article
Holland, A., Green, G., Tanner, B., & Mai, Z. (1991). X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon

X-ray Reflectometry From Semiconductor Surfaces And Interfaces (1991)
Journal Article
Tanner, B., Miles, S., Bowen, D., Hart, L., & Loxley, N. (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces

The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers (1991)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1991). The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers

Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers (1991)
Journal Article
Green, G., Tanner, B., Turnbull, A., Barnett, S., Emeny, M., & Whitehouse, C. (1991). Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers

Dislocation Images In X-ray Section Topographs Of Curved Crystals (1991)
Journal Article
Green, G., Loxley, N., & Tanner, B. (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal of Applied Crystallography, 24, 304-311

Structural analysis of high-T<SUB>c</SUB> epitaxial GdBa₂Cu₃O<SUB>7-x</SUB> superconducting thin films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Cui, S., Mai, Z., Li, H., …Wang, R. (1991). Structural analysis of high-Tc epitaxial GdBa₂Cu₃O7-x superconducting thin films

Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films (1991)
Journal Article
Bowen, D., Loxley, N., Tanner, B., Cooke, L., & Capano, M. (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films

Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds (1991)
Journal Article
Turnbull, A., Green, G., Tanner, B., & Halliwell, M. (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds

Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer (1991)
Journal Article
Green, G., Tanner, B., & Kightley, P. (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer

High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Li, H., Yi, H., & Wang, R. (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films

Measurement of aluminum concentration in epitaxial layers of Al<SUB>x</SUB>Ga<SUB>1 - x</SUB>As on GaAs by double axis x-ray diffractometry (1991)
Journal Article
Tanner, B., Turnbull, A., Stanley, C., Kean, A., & McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of AlxGa1 - xAs on GaAs by double axis x-ray diffractometry. Applied Physics Letters, 59, 2272-2274

Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. (1990)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS proceedings, 208, 119-124. https://doi.org/10.1557/proc-208-119

A new desk-side double-axis X-ray diffractometer capable of rapid, automatic measurement of lattice mismatch between epitaxial thin films and substrate in a two dimensional grid 150 mm square has been built. The design principles behind the five inde... Read More about Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization..

High-resolution X-ray-diffraction And Topography For Crystal Characterization (1990)
Journal Article
Tanner, B. (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal of Crystal Growth, 99, 1315-1323

Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals (1990)
Journal Article
Alourfi, M., & Tanner, B. (1990). Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals. Journal of Crystal Growth, 99, 139-144