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Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N/AlN/GaN heterostructures (2003)
Journal Article
Lafford, T., Parbrook, P., & Tanner, B. (2003). Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures. Applied Physics Letters, 83(26), 5434-5436. https://doi.org/10.1063/1.1637717

High-resolution x-ray diffraction, in surface symmetric, skew symmetric, and grazing incidence in-plane diffraction geometries, has been used to investigate the effect of an AlN interlayer between micron thick GaN and AlxGa1–xN layers grown by metalo... Read More about Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N/AlN/GaN heterostructures.

Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers (2003)
Journal Article
Hase, T., Buchanan, J., Tanner, B., Langridge, S., Dalgliesh, R., Foster, S., …Hickey, B. (2003). Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers. Journal of Applied Physics, 93(10), 6510-6512. https://doi.org/10.1063/1.1543876

Electron scattering mechanisms within metallic multilayers are affected by both structural and magnetic disorders. Off-specular x-ray scattering has long been used to probe the structural interfaces, and it is only recently that it has been applied t... Read More about Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers.

Direct measurement of twist mosaic in epitaxial GaN. (2003)
Journal Article
Lafford, T., Ryan, P., Joyce, D., Goorsky, M., & Tanner, B. (2003). Direct measurement of twist mosaic in epitaxial GaN. physica status solidi (a) – applications and materials science, 195(1), 265-270. https://doi.org/10.1002/pssa.200306270

The laboratory application of grazing incidence in-plane X-ray diffraction to the measurement of the in-plane (twist) mosaic of GaN epitaxial layers is demonstrated. Only a single measurement containing no extrapolation uncertainty is required. The r... Read More about Direct measurement of twist mosaic in epitaxial GaN..