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In-situ Direct Measurement Of Activation Energies For The Generation Of Misfit Dislocations In The Ingaas/gaas (001) System

Lacey, G; Whitehouse, CR; Parbrook, PJ; Cullis, AG; Keir, AM; Mock, P; Johnson, AD; Smith, GW; Clark, GF; Tanner, BK; Martin, T; Lunn, B; Hogg, JHC; Emeny, MT; Murphy, B; Bennett, S

Authors

G Lacey

CR Whitehouse

PJ Parbrook

AG Cullis

AM Keir

P Mock

AD Johnson

GW Smith

GF Clark

T Martin

B Lunn

JHC Hogg

MT Emeny

B Murphy

S Bennett



Citation

Lacey, G., Whitehouse, C., Parbrook, P., Cullis, A., Keir, A., Mock, P., …Bennett, S. (1998). In-situ Direct Measurement Of Activation Energies For The Generation Of Misfit Dislocations In The Ingaas/gaas (001) System. Applied Surface Science, 123, 718-724

Journal Article Type Article
Publication Date 1998
Journal Applied Surface Science
Print ISSN 0169-4332
Publisher Elsevier
Volume 123
Pages 718-724




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