X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review

Tanner, Brian K.

Abstract

A short review of X-ray topographic studies of crystals grown from solution is presented. The dislocation configurations characteristic of such crystals are described, and Klapper’s explanation in terms of minimization of the elastic energy of a dislocation per unit growth length is highlighted. It is shown that the principles apply to crystals grown not only from low temperature solution but also by hydrothermal growth and growth from fluxed melts. Recent studies of growth of protein crystals have found that they have similar dislocation configurations and characteristics to those of ionic and small organic molecule crystals grown from solution.

Citation

Tanner, B. K. (2023). X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review. Crystal Growth and Design, 23(4), 3026-3033. https://doi.org/10.1021/acs.cgd.2c01463

• Journal Article Type: Article
• Online Publication Date: Mar 10, 2023
• Publication Date: 2023
• Deposit Date: Apr 20, 2023
• Publicly Available Date: Apr 20, 2023
• Journal: Crystal Growth & Design
• Print ISSN: 1528-7483
• Electronic ISSN: 1528-7505
• Publisher: American Chemical Society
• Peer Reviewed: Peer Reviewed
• Volume: 23
• Issue: 4
• Pages: 3026-3033
• DOI: https://doi.org/10.1021/acs.cgd.2c01463