X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates
(2000)
Journal Article
Su, Y., Du, C., Tanner, B., Hatton, P., Collins, S., Brown, S., …Cheong, S. (2000). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates
Outputs (14)
Characterization Of Oxide Layers On Gaas Substrates (2000)
Journal Article
Allwood, D., Carline, R., Mason, N., Pickering, C., Tanner, B., & Walker, P. (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films, 364, 33-39
The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles (2000)
Journal Article
Li Bassi, A., Bottani, C., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. The European Physical Journal C, 18, 31-38
Dependence of the critical thickness on Si doping of InGaAs on GaAs (2000)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158