Dislocation Images In X-ray Section Topographs Of Curved Crystals
(1991)
Journal Article
Green, G., Loxley, N., & Tanner, B. (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal of Applied Crystallography, 24, 304-311
Outputs (369)
Structural analysis of high-T<SUB>c</SUB> epitaxial GdBa₂Cu₃O<SUB>7-x</SUB> superconducting thin films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Cui, S., Mai, Z., Li, H., …Wang, R. (1991). Structural analysis of high-Tc epitaxial GdBa₂Cu₃O7-x superconducting thin films
Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films (1991)
Journal Article
Bowen, D., Loxley, N., Tanner, B., Cooke, L., & Capano, M. (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films
Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds (1991)
Journal Article
Turnbull, A., Green, G., Tanner, B., & Halliwell, M. (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds
Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer (1991)
Journal Article
Green, G., Tanner, B., & Kightley, P. (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer
High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Li, H., Yi, H., & Wang, R. (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films
Measurement of aluminum concentration in epitaxial layers of Al<SUB>x</SUB>Ga<SUB>1 - x</SUB>As on GaAs by double axis x-ray diffractometry (1991)
Journal Article
Tanner, B., Turnbull, A., Stanley, C., Kean, A., & McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of AlxGa1 - xAs on GaAs by double axis x-ray diffractometry. Applied Physics Letters, 59, 2272-2274
Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. (1990)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS proceedings, 208, 119-124. https://doi.org/10.1557/proc-208-119A new desk-side double-axis X-ray diffractometer capable of rapid, automatic measurement of lattice mismatch between epitaxial thin films and substrate in a two dimensional grid 150 mm square has been built. The design principles behind the five inde... Read More about Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization..
High-resolution X-ray-diffraction And Topography For Crystal Characterization (1990)
Journal Article
Tanner, B. (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal of Crystal Growth, 99, 1315-1323
Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals (1990)
Journal Article
Alourfi, M., & Tanner, B. (1990). Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals. Journal of Crystal Growth, 99, 139-144