A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces
(1992)
Conference Proceeding
Loxley, N., Monteiro, A., Cooke, M., Bowen, D., & Tanner, B. (1992). A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces. In S. Pearton, D. Sadana, & J. Zavada (Eds.), . https://doi.org/10.1557/proc-240-219