Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques
(2017)
Conference Proceeding
Gorji, N., Tanner, B., Vijayaraghavan, R., Danilewsky, A., & McNally, P. (2017). Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques. . https://doi.org/10.1109/ectc.2017.175
Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon (2017)
Journal Article
Tanner, B., Allen, D., Wittge, J., Danilewsky, A., Garagorri, J., Gorostegui-Colinas, E., …McNally, P. (2017). Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon. Crystals, 7(11), Article 347. https://doi.org/10.3390/cryst7110347The crack geometry and associated strain field around Berkovich and Vickers indents on silicon have been studied by X-ray diffraction imaging and micro-Raman spectroscopy scanning. The techniques are complementary; the Raman data come from within a f... Read More about Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon.
Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport (2017)
Journal Article
Mullins, J., Dierre, F., Halliday, D., Tanner, B., Radley, I., Kang, Z., & Summers, C. (2017). Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport. Journal of Materials Science: Materials in Electronics, 28(16), 11950-11960. https://doi.org/10.1007/s10854-017-7004-5Bulk single crystals of zinc telluride up to 10 mm thick have been grown by the Multi-Tube Physical Vapour Transport technique and doped, in-situ during growth, with oxygen. Following hetero-epitaxial nucleation and buffer growth on 100 mm diameter G... Read More about Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport.
Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages (2017)
Journal Article
Tanner, B., Danilewsky, A., Vijayaraghavan, R., Cowley, A., & McNally, P. (2017). Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages. Journal of Applied Crystallography, 50(2), 547-554. https://doi.org/10.1107/s1600576717003132Transmission X-ray diffraction imaging in both monochromatic and white beam section mode has been used to measure quantitatively the displacement and warpage stress in encapsulated silicon devices. The displacement dependence with position on the die... Read More about Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages.
Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride (2017)
Journal Article
Harvey, J., Smithson, H., Siviour, C., Gasper, G. E., Sonnesyn, S. O., Tanner, B. K., & McLeish, T. (2017). Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride. Applied Optics, 56(19), G197-G204. https://doi.org/10.1364/ao.56.00g197The rainbow has been the subject of discussion across a variety of historical periods and cultures, and numerous optical explanations have been suggested. Here, we further explore the scientific treatise De iride [On the Rainbow] written by Robert Gr... Read More about Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride.