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Contrast Of Defects In X-ray Diffraction Topographs (1996)
Book Chapter
Tanner, B. (1996). Contrast Of Defects In X-ray Diffraction Topographs. In A. Authier, S. Lagomarsino, & B. K. Tanner (Eds.), X-Ray and Neutron Dynamical Diffraction, Theory and Applications (147-166). PLENUM PRESS DIV PLENUM PUBLISHING CORP

In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation (1995)
Journal Article
Barnett, S., Keir, A., Cullis, A., Johnson, A., Jefferson, J., Smith, G., …Castelli, C. (1995). In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation. Journal of Physics D: Applied Physics, 28, A17-A22