Effects of thickness on the cation segregation in epitaxial (001) and (110) La2/3Ca1/3MnO3 thin films
(2009)
Journal Article
Estrade, S., Rebled, J., Arbiol, J., Peiro, F., Infante, I., Herranz, G., …Bleloch, A. (2009). Effects of thickness on the cation segregation in epitaxial (001) and (110) La2/3Ca1/3MnO3 thin films. Applied Physics Letters, 95(7), Article 072507. https://doi.org/10.1063/1.3211130
Outputs (73)
Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films (2008)
Journal Article
Gianola, D., Mendis, B., Cheng, X., & Hemker, K. (2008). Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films. Materials Science and Engineering: A, 483, 637-640
Characterizing the microstructure and mechanical behavior of a two-phase NiCoCrAlY bond coat for thermal barrier systems (2008)
Journal Article
Hemker, K., Mendis, B., & Eberl, C. (2008). Characterizing the microstructure and mechanical behavior of a two-phase NiCoCrAlY bond coat for thermal barrier systems. Materials Science and Engineering: A, 483, 727-730
Elastic scattering of high-energy electrons by dopant atoms within a crystal in transmission electron microscopy (2008)
Journal Article
Mendis, B. (2008). Elastic scattering of high-energy electrons by dopant atoms within a crystal in transmission electron microscopy. Acta crystallographica. Section A, Foundations of crystallography, 64, 613-624. https://doi.org/10.1107/s0108767308024574
Thermal stability of microstructural phases in commercial NiCoCrAlY bond coats (2008)
Journal Article
Mendis, B., & Hemker, K. (2008). Thermal stability of microstructural phases in commercial NiCoCrAlY bond coats. Scripta Materialia, 58(4), 255-258
Bloch wave analysis of the Eshelby twist contrast around end-on screw dislocations in bcc Mo (2008)
Journal Article
Mendis, B., & Hemkerc, K. (2008). Bloch wave analysis of the Eshelby twist contrast around end-on screw dislocations in bcc Mo. Ultramicroscopy, 108(9), 855-864
Evolution of the premartensitic state in the NiAl phase of a NiCoCrAlY bond coat during thermal cycling (2007)
Journal Article
Mendis, B., & Hemker, K. (2007). Evolution of the premartensitic state in the NiAl phase of a NiCoCrAlY bond coat during thermal cycling. Philosophical Magazine, 87, 4229-4251
Microstructural observations of as-prepared and thermal cycled NiCoCrAlY bond coats (2006)
Journal Article
Mendis, B., Tryon, B., Pollock, T., & Hemker, K. (2006). Microstructural observations of as-prepared and thermal cycled NiCoCrAlY bond coats. Surface and Coatings Technology, 201(7), 3918-3925
Use of the Nye tensor in analyzing HREM images of bcc screw dislocations (2006)
Journal Article
Mendis, B., Mishin, Y., Hartley, C., & Hemker, K. (2006). Use of the Nye tensor in analyzing HREM images of bcc screw dislocations. Philosophical Magazine, 86(29-31), 4607-4640
Observations of reactive element gettering of sulfur in thermally grown oxide pegs (2006)
Journal Article
Mendis, B., Livi, K., & Hemker, K. (2006). Observations of reactive element gettering of sulfur in thermally grown oxide pegs. Scripta Materialia, 55(7), 589-592
Suzuki segregation to stacking faults in a Cu-Si alloy (2005)
Book Chapter
Mendis, B., Jones, I., & Smallman, R. (2005). Suzuki segregation to stacking faults in a Cu-Si alloy. In D. Martin, D. Muller, P. Midgley, & E. Stach (Eds.), Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure (137-142). Materials Research Society
HREM imaging of screw dislocation core structures in bcc metals (2005)
Book Chapter
Mendis, B., Mishin, Y., Hartley, C., & Hemker, K. (2005). HREM imaging of screw dislocation core structures in bcc metals. In D. C. Martin, D. A. Muller, P. A. Midgley, & E. A. Stach (Eds.), Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure (73-78). Cambridge University Press
Suzuki segregation in a binary Cu-Si alloy (2004)
Journal Article
Mendis, B., Jones, I., & Smallman, R. (2004). Suzuki segregation in a binary Cu-Si alloy. Journal of electron microscopy, 53(4), 311-323