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Suzuki segregation to stacking faults in a Cu-Si alloy

Mendis, BG; Jones, IP; Smallman, RE

Authors

IP Jones

RE Smallman



Contributors

D.C. Martin
Editor

D.A. Muller
Editor

P.A. Midgley
Editor

E.A. Stach
Editor

Citation

Mendis, B., Jones, I., & Smallman, R. (2005). Suzuki segregation to stacking faults in a Cu-Si alloy. In D. Martin, D. Muller, P. Midgley, & E. Stach (Eds.), Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure (137-142). Materials Research Society

Publication Date 2005
Publisher Materials Research Society
Pages 137-142
Series Title Materials Research Society Symposium Proceedings.
Series Number 839
Book Title Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure.
Additional Information Symposium on Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure held at the 2004 MRS Fall Meeting.