Electron energy loss spectroscopy of nano-scale CrAlYN/CrN-CrAlY(O)N/Cr(O)N multilayer coatings deposited by unbalanced magnetron sputtering
(2010)
Journal Article
Ross, I., Rainforth, W., Seabourne, C., Scott, A., Wang, P., Mendis, B., …Hovsepian, P. (2010). Electron energy loss spectroscopy of nano-scale CrAlYN/CrN-CrAlY(O)N/Cr(O)N multilayer coatings deposited by unbalanced magnetron sputtering. Thin Solid Films, 518(18), 5121-5127. https://doi.org/10.1016/j.tsf.2010.03.012
Professor Buddhika Mendis' Outputs (7)
Analysis of computational EELS modelling results for MgO-based systems (2010)
Journal Article
Seabourne, C., Scott, A., Vaughan, G., Brydson, R., Wang, S., Ward, R., …Petford-Long, A. (2010). Analysis of computational EELS modelling results for MgO-based systems. Ultramicroscopy, 110(8), 1059-1069. https://doi.org/10.1016/j.ultramic.2009.11.021
Preparation, Characterization, and Structural Phase Transitions in a New Family of Semiconducting Transition Metal Oxychalcogenides beta-La(2)O(2)MSe(2) (M = Mn, Fe) (2010)
Journal Article
McCabe, E., Free, D., Mendis, B., Higgins, J., & Evans, J. (2010). Preparation, Characterization, and Structural Phase Transitions in a New Family of Semiconducting Transition Metal Oxychalcogenides beta-La(2)O(2)MSe(2) (M = Mn, Fe). Chemistry of Materials, 22(22), 6171-6182. https://doi.org/10.1021/cm1023103
Electron beam-specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal (2010)
Journal Article
Mendis, B. (2010). Electron beam-specimen interactions and their effect on high-angle annular dark-field imaging of dopant atoms within a crystal. Acta crystallographica. Section A, Foundations of crystallography, 66, 407-420. https://doi.org/10.1107/s0108767310004770
A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy (2010)
Journal Article
Mendis, B., MacKenzie, M., & Craven, A. (2010). A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), 105-117. https://doi.org/10.1016/j.ultramic.2009.09.013
Nanofabrication of 30 nm Devices Incorporating Low Resistance Magnetic Tunnel Junctions (2010)
Journal Article
Macedo, R., Borme, J., Ferreira, R., Cardoso, S., Freitas, P., Mendis, B., & MacKenzie, M. (2010). Nanofabrication of 30 nm Devices Incorporating Low Resistance Magnetic Tunnel Junctions. Journal of Nanoscience and Nanotechnology, 10(9), 5951-5957. https://doi.org/10.1166/jnn.2010.2600
A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics (2010)
Journal Article
Mendis, B., Bowen, L., & Jiang, Q. (2010). A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics. Applied Physics Letters, 97(9), Article 092112. https://doi.org/10.1063/1.3486482A cathodoluminescence-based, contactless method for extracting the bulk minority carrier diffusion length and reduced recombination velocity of an individual grain boundary is applied to vapor grown CdTe epitaxial films. The measured diffusion length... Read More about A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics.