X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth

Barnett, S.J.; Whitehouse, C.R.; Keir, A.M.; Clark, G.F.; Usher, B.; Tanner, B.K.; Emeny, M.T.; Johnson, A.D.

A novel high dynamic range X-ray detector for synchrotron radiation studies (1995)
Journal Article
Cockerton, S., Tanner, B., & Derbyshire, G. (1995). A novel high dynamic range X-ray detector for synchrotron radiation studies. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 97, 561-566

A Comparison Of Techniques For Nondestructive Composition Measurements In Cdznte Substrates (1995)
Journal Article
Tobin, S., Tower, J., Norton, P., Chandlerhorowitz, D., Amirtharaj, P., Lopes, V., …Tanner, B. (1995). A Comparison Of Techniques For Nondestructive Composition Measurements In Cdznte Substrates. Journal of Electronic Materials, 24, 697-705

In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation (1995)
Journal Article
Barnett, S., Keir, A., Cullis, A., Johnson, A., Jefferson, J., Smith, G., …Castelli, C. (1995). In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation. Journal of Physics D: Applied Physics, 28, A17-A22

Dislocation Distributions In Cd1-xhgxte/cdte And Cd(1-x) Hgxte/cd1-yznyte Grown By Liquid Phase Epitaxy (1995)
Book Chapter
Watson, C., Durose, K., Okeefe, E., Hudson, J., & Tanner, B. (1995). Dislocation Distributions In Cd1-xhgxte/cdte And Cd(1-x) Hgxte/cd1-yznyte Grown By Liquid Phase Epitaxy. In S. Baker, C. Ross, P. Townsend, C. Volkert, & P. Borgesen (Eds.), Thin Films: Stresses and Mechanical Properties V (301-306). Materials Research Society

Fourier Transformation Of X-ray Rocking Curves From Interferometer Structures (1994)
Journal Article
Hudson, J., Tanner, B., & Blunt, R. (1994). Fourier Transformation Of X-ray Rocking Curves From Interferometer Structures. Advances in x-ray analysis, 37, 135-144

New Methods For The Accurate Comparison Of Lattice-parameters (1994)
Journal Article
Bowen, D., & Tanner, B. (1994). New Methods For The Accurate Comparison Of Lattice-parameters. Advances in x-ray analysis, 37, 123-128

Dislocation Contrast In X-ray Reflection Topography Of Strained Heterostructures (1994)
Journal Article
Spirkl, W., Tanner, B., Whitehouse, C., Barnett, S., Cullis, A., Johnson, A., …Lunn, B. (1994). Dislocation Contrast In X-ray Reflection Topography Of Strained Heterostructures. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 70, 531-548

Simulation Of X-ray Reflection Topographs From Misfit Dislocations (1994)
Journal Article
Spirkl, W., Tanner, B., Whitehouse, C., Barnett, S., Cullis, A., Johnson, A., …Lunn, B. (1994). Simulation Of X-ray Reflection Topographs From Misfit Dislocations. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 69, 221-236

Experimental Comparison Of Widely Differing Lattice-parameters (1994)
Journal Article
Bowen, D., Tanner, B., Hudson, J., Pape, I., Loxley, N., & Tobin, S. (1994). Experimental Comparison Of Widely Differing Lattice-parameters. Advances in x-ray analysis, 37, 129-133

Application Of Synchrotron X-ray Topography To The Study Of Materials (1994)
Journal Article
Tanner, B. (1994). Application Of Synchrotron X-ray Topography To The Study Of Materials. Acta Physica Polonica. A, 86, 537-544

The magnetic properties of specially prepared pearlitic steels of varying carbon content as a function of plastic deformation (1994)
Journal Article
Thompson, S., & Tanner, B. (1994). The magnetic properties of specially prepared pearlitic steels of varying carbon content as a function of plastic deformation. Journal of Magnetism and Magnetic Materials, 132, 71-88

High-speed Characterization Of Pseudomorphic Hemt Structures Using A Very-low Noise Scintillation Detector (1994)
Journal Article
Loxley, N., Cockerton, S., & Tanner, B. (1994). High-speed Characterization Of Pseudomorphic Hemt Structures Using A Very-low Noise Scintillation Detector. Advances in x-ray analysis, 37, 145-151

High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films (1993)
Journal Article
Tanner, B., Hallam, T., Funaki, M., & Brinkman, A. (1993). High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films. MRS proceedings, 280, 635-640

X-ray topography studies of the defect depth profile in processed silicon wafers (1993)
Journal Article
Halfpenny, P., Green, G., & Tanner, B. (1993). X-ray topography studies of the defect depth profile in processed silicon wafers. Journal of Physics D: Applied Physics, 26, A65-A68

Contrast of device structures in X-ray section topographs (1993)
Journal Article
Holland, A., & Tanner, B. (1993). Contrast of device structures in X-ray section topographs. Journal of Physics D: Applied Physics, 26, A137-A141

The magnetic properties of pearlitic steels as a function of carbon content (1993)
Journal Article
Thompson, S., & Tanner, B. (1993). The magnetic properties of pearlitic steels as a function of carbon content. Journal of Magnetism and Magnetic Materials, 123, 283-298

Characterization of engineering surfaces by grazing-incidence X-ray reflectivity (1993)
Journal Article
Bowen, D., & Tanner, B. (1993). Characterization of engineering surfaces by grazing-incidence X-ray reflectivity. Nanotechnology, 4, 175-182

Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process (1993)
Journal Article
Funaki, M., Brinkman, A., Hallam, T., & Tanner, B. (1993). Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process. Applied Physics Letters, 62, 2983-2985

X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films (1993)
Journal Article
Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., …Tanner, B. (1993). X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films. Journal of Physics D: Applied Physics, 26, 161-

X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth (1993)
Journal Article
Barnett, S., Whitehouse, C., Keir, A., Clark, G., Usher, B., Tanner, B., …Johnson, A. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D: Applied Physics, 26, A45-A49

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