High resolution divergent-beam X-ray topography

Tanner, B K; Humphreys, C J

Abstract

The resolution and contrast of divergent-beam x-ray topographs is discussed. It is shown that tungsten Lα radiation can be used to reduce exposures and the x-ray examination of thinned electron microscope specimens is demonstrated.

Citation

Tanner, B. K., & Humphreys, C. J. (1970). High resolution divergent-beam X-ray topography. Journal of Physics D: Applied Physics, 3(7), 1144-1146. https://doi.org/10.1088/0022-3727/3/7/421

• Journal Article Type: Article
• Online Publication Date: May 14, 2002
• Publication Date: Jul 1, 1970
• Deposit Date: May 16, 2024
• Journal: Journal of Physics D: Applied Physics
• Print ISSN: 0022-3727
• Electronic ISSN: 1361-6463
• Publisher: IOP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 3
• Issue: 7
• Pages: 1144-1146
• DOI: https://doi.org/10.1088/0022-3727/3/7/421
• Public URL: https://durham-repository.worktribe.com/output/2441488