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Modelling dynamical 3D electron diffraction intensities. I. A scattering cluster algorithm

Mendis, Budhika

Modelling dynamical 3D electron diffraction intensities. I. A scattering cluster algorithm Thumbnail


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Abstract

Three‐dimensional electron diffraction (3D‐ED) is a powerful technique for crystallographic characterization of nanometre‐sized crystals that are too small for X‐ray diffraction. For accurate crystal structure refinement, however, it is important that the Bragg diffracted intensities are treated dynamically. Bloch wave simulations are often used in 3D‐ED, but can be computationally expensive for large unit cell crystals due to the large number of diffracted beams. Proposed here is an alternative method, the `scattering cluster algorithm' (SCA), that replaces the eigen‐decomposition operation in Bloch waves with a simpler matrix multiplication. The underlying principle of SCA is that the intensity of a given Bragg reflection is largely determined by intensity transfer (i.e. `scattering') from a cluster of neighbouring diffracted beams. However, the penalty for using matrix multiplication is that the sample must be divided into a series of thin slices and the diffracted beams calculated iteratively, similar to the multislice approach. Therefore, SCA is more suitable for thin specimens. The accuracy and speed of SCA are demonstrated on tri‐isopropyl silane (TIPS) pentacene and rubrene, two exemplar organic materials with large unit cells.

Citation

Mendis, B. (2024). Modelling dynamical 3D electron diffraction intensities. I. A scattering cluster algorithm. Acta Crystallographica Section A: Foundations and Advances, 80(2), 167-177. https://doi.org/10.1107/s2053273323010689

Journal Article Type Article
Acceptance Date Dec 13, 2023
Online Publication Date Jan 25, 2024
Publication Date 2024-03
Deposit Date Feb 28, 2024
Publicly Available Date Feb 28, 2024
Journal Acta Crystallographica Section A
Print ISSN 2053-2733
Electronic ISSN 2053-2733
Publisher International Union of Crystallography
Peer Reviewed Peer Reviewed
Volume 80
Issue 2
Pages 167-177
DOI https://doi.org/10.1107/s2053273323010689
Public URL https://durham-repository.worktribe.com/output/2174545

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