TA Lafford
Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan
Lafford, TA; Parbrook, PJ; Tanner, BK
Authors
Contributors
A. Hoffmann
Editor
A. Rizzi
Editor
Citation
Lafford, T., Parbrook, P., & Tanner, B. (2002). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. In A. Hoffmann, & A. Rizzi (Eds.),
| Conference Name | International Workshop on Nitride Semiconductors (IWN 2002) |
|---|---|
| Conference Location | Aachen, Germany |
| Publication Date | 2002 |
| Publisher | Wiley-VCH Verlag |
| Pages | 542-545 |
| Series Title | Proceedings of the International Workshop on Nitride Semiconductors |
| Public URL | https://durham-repository.worktribe.com/output/1680766 |
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